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Reliability of High Speed Ultra Low Voltage Differential CMOS Logic

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DOI: 10.4236/cs.2015.65013    2,866 Downloads   3,367 Views   Citations

ABSTRACT

In this paper, we present a solution to the ultra low voltage inverter by adding a keeper transistor in order to make the semi-floating-gate more stable and to reduce the current dissipation. Moreover, we also present a differential ULV inverter and elaborate on the reliability and fault tolerance of the gate. The differential ULV gate compared to both a former ULV gate and standard CMOS are given. The results are obtained through Monte-Carlo simulations.

Cite this paper

Mirmotahari, O. and Berg, Y. (2015) Reliability of High Speed Ultra Low Voltage Differential CMOS Logic. Circuits and Systems, 6, 121-135. doi: 10.4236/cs.2015.65013.

Conflicts of Interest

The authors declare no conflicts of interest.

References

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