[1]
|
L.-J. Lai, H.-C. Lu, H.-K. Chen, B.-M. Cheng, M.-I Lin and T.-C. Chu, “Photoluminescence of Zirconia Films with VUV Excitation,” Journal of Electron Spectroscopy and Related Phenomena, Vol. 144-147, 2005, pp. 865-868. http://dx.doi.org/10.1016/j.elspec.2005.01.222
|
[2]
|
H.-C. Lu, H.-K. Chen, T.-Y. Tseng, W.-L. Kuo, M. S. Alam and B.-M. Cheng, “Photoluminescence of Phosphors for PDP with VUV Excitation,” Journal of Electron Spectroscopy and Related Phenomena, Vol. 144-147, 2005, pp. 983-985. http://dx.doi.org/10.1016/j.elspec.2005.01.232
|
[3]
|
A. Tallaire, A. T. Collins, D. Charles, J. Achard, R. Sussmann, A. Gicquel, M. E. Newton, A. M. Edmonds and R. J. Cruddace, “Characterisation of High-Quality Thick Single-Crystal Diamond Grown by CVD with a Low Nitrogen Addition,” Diamond & Related Materials, Vol. 15, No. 10, 2006, pp. 1700-1707. http://dx.doi.org/10.1016/j.diamond.2006.02.005
|
[4]
|
A. M. Zaitsev, “Optical Properties of Diamond: A Data Handbook,” Springer-Verlag, Berlin, Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-662-04548-0
|
[5]
|
H.-C. Lu and B.-M. Cheng, “Analysis of Nitrogen Defects in Diamond with VUV Photoluminescence,” Analytical Chemistry, Vol. 83, No. 17, 2011, pp. 6539-6544. http://dx.doi.org/10.1021/ac200808n
|
[6]
|
B. Rondeau, E. Fritsch, M. Guiraud, J.-P. Chalain and F. Notari, “Three Historical ‘Asteriated’ Hydrogen-Rich Diamonds: Growth History and Sector-Dependent Impurity Incorporation,” Diamond & Related Materials, Vol. 13, No. 9, 2004, pp. 1658-1673. http://dx.doi.org/10.1016/j.diamond.2004.02.002
|
[7]
|
L. H. Robins, P. J. H. Tjossem, K. C. Smyth, P. Y. Barnes, E. N. Farabaugh and A. Feldman, “Photoluminescence Excitation by Bandgap Optical Absorption in Chemical Vapor Deposition Diamond Films,” Journal of Applied Physics, Vol. 69, No. 6, 1991, pp. 3702-3708. http://dx.doi.org/10.1063/1.348463
|
[8]
|
H.-C. Lu, M.-Y. Lin, S.-L. Chou, Y.-C. Peng, J.-I. Lo and B.-M. Cheng, “Identification of Nitrogen Defects in Diamond with Photoluminescence Excited in the 160-240 nm Region,” Analytical. Chemistry, Vol. 84, No. 21, 2014, pp. 9596-9600.
|