Energy and Power Engineering
Volume 5, Issue 2 (April 2013)
ISSN Print: 1949-243X ISSN Online: 1947-3818
Google-based Impact Factor: 1.42 Citations
Microstructure Analysis and Properties of Anti-Reflection Thin Films for Spherical Silicon Solar Cells ()
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ABSTRACT
Structure and properties of anti-reflection thin films of spherical silicon solar cells were investigated and discussed. Conversion efficiencies of spherical Si solar cells coated with F-doped SnO2 anti-reflection films were improved by annealing. Optical absorption and fluorescence of the solar cells increased after annealing. Lattice constants of F-doped SnO2 anti-reflection layers, which were investigated by X-ray diffraction, decreased after annealing. A mechanism of atomic diffusion of F in SnO2 was discussed. The present work indicated a guideline for spherical silicon solar cells with higher efficiencies.
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