Author(s)

M. Bashahu, D. Ngendabanyikwa, P. Nyandwi

Department of Physics and Technology, Institute of Applied Pedagogy, Bujumbura, Burundi.

Several parameters of a commercial Si-based Schottky barrier diode (SBD) with unknown metal material and semiconductor-type have been investigated in this work from dark forward and reverse I-V characteristics in the temperature (T) range of [274.5 K - 366.5 K]. Those parameters include the reverse saturation current (I_s), the ideality factor (n), the series and the shunt resistances (R_s and R_sh), the effective and the zero bias barrier heights (Φ_B and Φ_B0), the product of the electrical active area (A) and the effective Richardson constant (A**), the built-in potential (V_bi), together with the semiconductor doping concentration (N_A or N_D). Some of them have been extracted by using two or three different methods. The main features of each approach have been clearly stated. From one parameter to another, results have been discussed in terms of structure performance, comparison on one another when extracted from different methods, accordance or discordance with data from other works, and parameter’s temperature or voltage dependence. A comparison of results on Φ_B, Φ_B0, n and N_A or N_D parameters with some available data in literature for the same parameters, has especially led to clear propositions on the identity of the analyzed SBD’s metal and semiconductor-type.

SBD, Dark Forward and Reverse I-V-T Characteristics, Different Parameters Extraction Methods, Identification of the Structure’s Metal and Semiconductor-Type

Bashahu, M. , Ngendabanyikwa, D. and Nyandwi, P. (2022) Non Ideal Schottky Barrier Diode’s Parameters Extraction and Materials Identification from Dark I-V-T Characteristics. Journal of Modern Physics, 13, 285-300. doi: 10.4236/jmp.2022.133020.