Author(s)

Dennis C. Gitz III, Jeffrey T. Baker, Zhanguo Xin, John E. Stout, Robert J. Lascano

USDA-Agricultural Research Service1, Cropping Systems Research Laboratory, Lubbock, TX, USA.

Multiseed (msd) mutant sorghum [Sorghum bicolor (L.) Moench] lines with greatly increased seed numbers were developed. It was originally thought that the msd trait could increase grain yield several times in comparison with the wild type from which the mutant was derived. However, in a small plot trial, msd seed yield decreased when compared to the parent line. Herein we report results that msd seed yield remained either unchanged or slightly increased in comparison to the parent line. We suggest that attempts to measure msd sorghum seed yield were complicated due to systematic errors associated with the post-harvest processing methods, including threshing and pneumatic winnowing equipment that was used for harvest. That is, seed recovery and seed loss from individual panicles were affected by the post-harvest processing. When evaluating sorghum grain yield of types with different seed sizes, threshing and seed cleaning harvesting methods should be optimized for each sorghum line.

Sorghum, Yield, Yield Components, msd, Multiseed, Yield Measurement, Error

Gitz III, D. , Baker, J. , Xin, Z. , Stout, J. and Lascano, R. (2019) Systematic Errors Introduced into Sorghum Grain Yield Data: Does the Multiseed (msd) Trait Increase Sorghum Seed Yield?. American Journal of Plant Sciences, 10, 1503-1516. doi: 10.4236/ajps.2019.109106.