Thin Film Evolution Equation for a Strained Anisotropic Solid Film on a Deformable Isotropic Substrate ()
ABSTRACT
We consider a continuum model for the evolution of
an epitaxially-strained dislocation-free anisotropic thin solid film on
isotropic deformable substrate in the absence of vapor deposition. By using a
thin film approximation we derived a nonlinear evolution equation. We examined
the nonlinear evolution equation and found that there is a critical film
thickness below which every film thickness is stable and a critical wave number
above which every film thickness is stable.
Share and Cite:
Tekalign, W. and Atena, A. (2018) Thin Film Evolution Equation for a Strained Anisotropic Solid Film on a Deformable Isotropic Substrate.
Journal of Applied Mathematics and Physics,
6, 864-879. doi:
10.4236/jamp.2018.64074.