Author(s)

Mathias Wendt^1,2, Andreas Plöβl², Andreas Weimar², Marcus Zenger², Klaus Dilger¹

¹Institut für Füge-und Schweiβtechnik, Technische Universität Braunschweig, Braunschweig, Germany.
²Osram Opto Semiconductors GmbH, Leibnizstraβe 4, Regensburg, Germany.

The reaction between high purity nickel (99.999%) and high purity tin (99.999%) was investigated in the temperature range of 232℃ - 330℃, at short periods of annealing (1 - 60 s). The reaction kinetic was studied using cross-sectional scanning electron microscope (SEM) images. The intermetallic compound (IMC) growth was analyzed using the empirical power law and a time dependence in the range of 0.26 to 0.33 was found. The morphology of the IMC was investigated by SEM in the temperature range of 235℃ - 290℃, at annealing periods of 10 s, 30 s, and 60 s by selectively etching away the remaining elementary tin. The exposed IMC displays a change in morphology with increasing annealing temperature, demonstrating that the growth velocity of certain crystallographic orientations of the IMC is strongly influenced by the annealing temperature. Additionally, coarsening and crumbling of the IMC grains is observed, and will be discussed with respect to the responsible mechanisms.

Lead-Free Solders, Intermetallic Compound Formation, Grain Growth, Coarsening, Solid Liquid Inter-Diffusion (SLID) Bonding

Wendt, M. , Plöβl, A. , Weimar, A. , Zenger, M. and Dilger, K. (2016) Investigation of the Influence of Annealing Temperature on the Morphology and Growth Kinetic of Ni3Sn4 in the Ni-Sn-Solder System. Journal of Materials Science and Chemical Engineering, 4, 116-130. doi: 10.4236/msce.2016.42013.