Login
Login
切换导航
Home
Articles
Journals
Books
News
About
Services
Submit
Home
Journal
Citations
Journals Menu
Articles
Archive
Indexing
Aims & Scope
Editorial Board
For Authors
Publication Fees
Open Special Issues
Published Special Issues
Special Issues Guideline
Follow SCIRP
Contact us
+1 323-425-8868
customer@scirp.org
+86 18163351462(WhatsApp)
1655362766
Paper Publishing WeChat
Advances in Materials Physics and Chemistry
Submission
Advances in Materials Physics and Chemistry
ISSN Print:
2162-531X
ISSN Online:
2162-5328
www.scirp.org/journal/ampc
E-mail:
ampc@scirp.org
Google-based Impact Factor:
0.65
Citations
h5
-index & Ranking
Journals Menu
Articles
Archive
Indexing
Aims & Scope
Editorial Board
For Authors
Publication Fees
"
Surface Mapping of Resistive Switching CrO
x
Thin Films
"
written by
Kim Ngoc Pham, Kieu Hanh Thi Ta, Lien Thuong Thi Nguyen, Vinh Cao Tran, Bach Thang Phan
,
published by
Advances in Materials Physics and Chemistry
,
Vol.6 No.3, 2016
has been cited by the following article(s):
Google Scholar
CrossRef
[1]
Defect dynamics in the resistive switching characteristics of Y0. 95Sr0. 05MnO3 films induced by electronic excitations
2019
[2]
Positioning Technology of Tiny Electronic Components Based on Microscope and Computer Vision
[1]
Defect dynamics in the resistive switching characteristics of Y0.95Sr0.05MnO3 films induced by electronic excitations
Journal of Alloys and Compounds
,
2019
DOI:
10.1016/j.jallcom.2019.02.221
Most cited
Most downloaded
E-Mail Alert
AMPC Subscription
Publication Ethics & OA Statement
Frequently Asked Questions
Recommend to Peers
Recommend to Library
Contact us
Disclaimer
History Issue
Open Special Issues
Published Special Issues
Special Issues Guideline
Follow SCIRP
Contact us
+1 323-425-8868
customer@scirp.org
+86 18163351462(WhatsApp)
1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Home
Journals A-Z
Subject
Books
Sitemap
Contact Us
About SCIRP
Publication Fees
For Authors
Peer-Review Issues
Special Issues
News
Service
Manuscript Tracking System
Subscription
Translation & Proofreading
FAQ
Volume & Issue
Policies
Open Access
Publication Ethics
Preservation
Retraction
Privacy Policy
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top