Structural Design of an Electrically Erasable EEPROM Memory Cell

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ISSN Print: 2331-4222
ISSN Online: 2331-4249
www.scirp.org/journal/wjet
E-mail: wjet@scirp.org

"Structural Design of an Electrically Erasable EEPROM Memory Cell"
written by Lei Zhao,
published by World Journal of Engineering and Technology, Vol.8 No.2, 2020

has been cited by the following article(s):

[1]	EEPROM endurance degradation at different temperatures: State of the art TCAD simulation
	Pellerin… - Microelectronics …, 2022

[2]	APLIKASI MIKROKONTROLER ARDUINO UNO DALAM RANCANG BANGUN KUNCI PINTU MENGGUNAKAN E-KTP
	Jusikom: Jurnal …, 2022

[3]	An Overview on Nonvolatile Memories Used in Automotive Industry
	Andrei, OM Andrei, A Sebastian… - … and Energy Systems …, 2021

[4]	Investigation of the effect of gamma irradiation on the Electrical characteristics of EEPROMs

[1]	VI-characteristics and transient analysis of an EEPROM device 2023 7th International Conference on Trends in Electronics and Informatics (ICOEI), 2023 DOI:10.1109/ICOEI56765.2023.10125983

[2]	EEPROM endurance degradation at different temperatures: State of the art TCAD simulation Microelectronics Reliability, 2022 DOI:10.1016/j.microrel.2022.114717

[3]	EEPROM endurance degradation at different temperatures: State of the art TCAD simulation Microelectronics Reliability, 2022 DOI:10.1016/j.microrel.2022.114717

[4]	EEPROM endurance degradation at different temperatures: State of the art TCAD simulation Microelectronics Reliability, 2022 DOI:10.1016/j.microrel.2022.114717

[5]	An Overview on Nonvolatile Memories Used in Automotive Industry 2021 International Conference on Electromechanical and Energy Systems (SIELMEN), 2021 DOI:10.1109/SIELMEN53755.2021.9600442

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