Moments and Cumulants of Diffraction Profiles Broadened by Stacking Faults

Journals Menu

Follow SCIRP

ISSN Print: 2161-7678
ISSN Online: 2161-7686
www.scirp.org/journal/jcpt
E-mail: jcpt@scirp.org

Citations

"Moments and Cumulants of Diffraction Profiles Broadened by Stacking Faults"
written by Girija Bhushan Mitra,
published by Journal of Crystallization Process and Technology, Vol.3 No.3, 2013

has been cited by the following article(s):

[1]	Effect of High-Pressure Torsion on the Microstructure and Magnetic Properties of Nanocrystalline CoCrFeNiGax (x = 0.5, 1.0) High Entropy Alloys
	Materials, 2022

[2]	Scherrer formula: estimation of error in determining small nanoparticle size
	2018

[3]	Theoretical Model of Diffraction Line Profiles as Combinations of Gaussian and Cauchy Distributions
	Journal of Crystallization Process and Technology, 2014

Follow SCIRP