Special Issue on
Measurement and
Control Technology and Instrument
Measurement and Control
Technology and Instrument studies acquisition and processing of information. It
is the source of information science and technology, is theory and technology
of controlling the related factors and is a new and high technology intensive
integrated program which is formed by the integration of optics, precision
machinery, electronics, electric power, automatic control, signal processing,
computer and information technology. The goal of this special issue is to provide a platform for scientists
and academics all over the world to promote, share and discuss various new
issues and developments in Measurement and Control Technology and
Instrument.
In this special issue, we invite
front-line researchers and authors to submit original research and review
articles that explore Measurement and Control Technology and
Instrument. In this special issue, potential
topics include, but are not limited to:
-
Electronics, signal processing
-
Measurements and control
-
Embedded systems
-
Intelligent measurement and control system and instrument
-
Microprocessor and embedded system design
-
Process control engineering
-
Precision mechanical design
Authors should read
over the journal’s For Authors carefully before
submission. Prospective authors should submit an electronic copy of their
complete manuscript through the journal’s Paper Submission System.
Please kindly specify the “Special Issue”
under your manuscript title. The research field “Special Issue - Measurement and Control
Technology and Instrument” should be selected
during your submission.
Special Issue timetable:
Submission Deadline
|
May 21st, 2024
|
Publication Date
|
July 2024
|
Guest Editor:
For further
questions or inquiries
Please contact the
Editorial Assistant at
wjet@scirp.org