Special Issue on X-Ray Diffraction
X-ray Diffraction (XRD) is one of the primary techniques used by mineralogists and solid state chemists to examine the physico-chemical make-up of unknown solids. This data is represented in a collection of single-phase X-ray powder diffraction patterns for the three most intense D values in the form of tables of interplanar spacings (D), relative intensities (I/Io), and mineral name.
The XRD technique takes a sample of the material and places a powdered sample in a holder, then the sample is illuminated with x-rays of a fixed wave-length and the intensity of the reflected radiation is recorded using a go-niometer. This data is then analyzed for the reflection angle to calculate the inter-atomic spacing (D value in Angstrom units - 10-8 cm). The intensity(I) is measured to discriminate (using I ratios) the various D spacings and the results are to identify possible matches.
In this special issue, we intend to invite front-line researchers and authors to submit original research and review articles on exploring X-Ray Diffraction.
Authors should read over the journal’s Author’s Guidelines carefully before submission, Prospective authors should submit an electronic copy of their complete manuscript through the journal Paper Submission System.
Please kindly notice that the “Special Issue’’ under your manuscript title is supposed to be specified and the research field “Special Issue-X-Ray Diffraction” should be chosen during your submission.
According to the following timetable:
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Manuscript Due
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February 20th, 2013
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Publication Date
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April 2013
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Editor-in-Chief
Prof.Zhiwen Chen
Shanghai University, China
For further questions or inquiries
Please contact Editorial Assistant at
ampc@scirp.org