Advances in Materials Physics and Chemistry

Vol.10 No.9(2020), Paper ID 103178, 8 pages

DOI:10.4236/ampc.2020.109015

 

Structural Characterization of Thin Epitaxial GaN Films on Polymer Polyimides Substrates by Ion Beam Assisted Deposition

 

Sri Vidawati, Jürgen W. Gerlach, Benjamin Herold, Bernd Rauschenbach

 

Faculty of Post Graduate, National Institute of Science and Technology, Jakarta 12640, Indonesia
Leibniz Institute of Surface Engineering (IOM), Permoserstrasse 15, D-04318 Leipzig, Germany
Leibniz Institute of Surface Engineering (IOM), Permoserstrasse 15, D-04318 Leipzig, Germany
Leibniz Institute of Surface Engineering (IOM), Permoserstrasse 15, D-04318 Leipzig, Germany

 

Copyright © 2020 Sri Vidawati, Jürgen W. Gerlach, Benjamin Herold, Bernd Rauschenbach et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


Vidawati, S. , Gerlach, J. , Herold, B. and Rauschenbach, B. (2020) Structural Characterization of Thin Epitaxial GaN Films on Polymer Polyimides Substrates by Ion Beam Assisted Deposition. Advances in Materials Physics and Chemistry, 10, 199-206. doi: 10.4236/ampc.2020.109015.

Copyright © 2026 by authors and Scientific Research Publishing Inc.

Creative Commons License

This work and the related PDF file are licensed under a Creative Commons Attribution 4.0 International License.