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MSCE> Vol.2 No.12, December 2014
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Preparation and Characterization of ZnO Nanocrystalline Layers

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DOI: 10.4236/msce.2014.212001    3,251 Downloads   4,724 Views  
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A. Haddad1, A. Hafidi1, A. Ain-Souya1, N. Chahmat1, R. Ganfoudi2, M. Ghers1

Affiliation(s)

1Laboratory for the Study of Surfaces and Interfaces of Solid Material (LESIMS), Badji Mokhtar-Annaba University, Annaba, Algeria.
2Physics Laboratory of Matter and Radiation (LPMR), Med Cherif Mesaadia-Souk Ahras University, Souk Ahras, Algeria.

ABSTRACT

This work consists on the study of the optical properties of zinc oxide layers. These Layers are elaborated under various conditions by cathode sputtering on glass substrates and by thermal oxidations of Zn layers deposited on different types of substrates by vacuum evaporation. The oxidation treatments of Zn are made in oxygen atmosphere at temperatures between 400°C and 450°C for different times. The analyses by diffraction of X-rays, Optical Microscopy and Scanning electron microscopy enabled us to understand that the zinc oxide films deposited by cathode sputtering on a glass substrate and having a thickness of at least 240 nm and those prepared by thermal oxidation at 450°C during 2 hours of layers of Zn on an alumina substrate are homogeneous and consist of grains of size 30 nm. The optical transmission measurements show that the gap is around 3.02 eV for layers obtained by oxidation and 3.3 eV for those deposited by sputtering. These samples have a good optical transparency in the visible.

KEYWORDS

Oxide, Gas, Adsorption, Conductance, Properties

Cite this paper

Haddad, A. , Hafidi, A. , Ain-Souya, A. , Chahmat, N. , Ganfoudi, R. and Ghers, M. (2014) Preparation and Characterization of ZnO Nanocrystalline Layers. Journal of Materials Science and Chemical Engineering, 2, 1-6. doi: 10.4236/msce.2014.212001.

Conflicts of Interest

The authors declare no conflicts of interest.

References

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http://dx.doi.org/10.1016/j.matchemphys.2005.07.072
[3] EL-Fadl, A.A., Mohamed, G.A., Abd EL-Moiz, A.B. and Roshad, M. (2005) Optical Constants of Zn1-xLixO Films Prepared by Chemical Bath Deposition Technique. Physica B, 366, 44-45.
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[4] Look, D.C., Coskum, C., Claflim, B. and Farlow, G.C. (2003) Proceedings of the 22nd International Conference on Defects in Semiconductors. Physica B: Condensed Mater, 340-342, 32-38.

  
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