XANES and XPS Study on Microstructure of Mn-Doped ZnO Films

DOI: 10.4236/msa.2013.45039   PDF   HTML   XML   5,438 Downloads   8,864 Views   Citations


Microstructure of ZnO:Mn films with various Mn concentration was investigated with XANES and XPS. The experimental results revealed a substitution of Mn in ZnO and also excluded the existence of Mn oxides or metallic manganese clusters. The substitutional Mn presented a divalent state and all the ZnO:Mn films were n-type. Room temperature ferromagnetism monotonously decreases with the decrease of the electron carrier concentration. The observed ferrmagnetism should come from the carrier-mediated exchange.

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B. Zhang, M. Li, J. Wang, L. Shi and H. Cheng, "XANES and XPS Study on Microstructure of Mn-Doped ZnO Films," Materials Sciences and Applications, Vol. 4 No. 5, 2013, pp. 307-311. doi: 10.4236/msa.2013.45039.

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The authors declare no conflicts of interest.


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