OPJ> Vol.3 No.2BB, June 2013

State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China

 

Copyright © 2013 Dong-pei Qian, Chuan-gui Wu, Yao Shuai, Wen-bo Luo, Qiang-xiang Peng, Xiao-yong Chen, Wan-li Zhang et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article

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D. Qian, C. Wu, Y. Shuai, W. Luo, Q. Peng, X. Chen and W. Zhang, "Hardening and Optimizing of the Black Gold Thin Film as the Absorption Layer for Infrared Detector," Optics and Photonics Journal, Vol. 3 No. 2B, 2013, pp. 281-283. doi: 10.4236/opj.2013.32B066.

 

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