An IEEE 1149.x Embedded Test Coprocessor

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Circuits and Systems

ISSN Print: 2153-1285
ISSN Online: 2153-1293
www.scirp.org/journal/cs
E-mail: cs@scirp.org

Citations h5-index & Ranking*

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"An IEEE 1149.x Embedded Test Coprocessor"
written by Ukbagiorgis Iyasu Gebremeskel, José Manuel Martins Ferreira,
published by Circuits and Systems, Vol.5 No.7, 2014

has been cited by the following article(s):

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[1]	A general boundary scan test system based on EDIF netlist file transfer to Protel netlist file
	International Journal of Materials and Structural Integrity, 2016