Study of Quantitative and Qualitative Characteristics of Nickel Clusters and Semiconductor Structures

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DOI: 10.4236/msce.2016.45005    1,838 Downloads   2,573 Views  Citations

ABSTRACT

The possibility of building of clusters of impurity atoms of Ni in silicon and controlling their parameters is currently investigated in the present research article. Our group develops a special technique for doping, the so-called “low-temperature doping” of semiconductors. This method of doping is based upon the diffusion process which is carried out in stages by gradually increasing temperature ranging from room temperature to the diffusion temperature.

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Saitov, E. (2016) Study of Quantitative and Qualitative Characteristics of Nickel Clusters and Semiconductor Structures. Journal of Materials Science and Chemical Engineering, 4, 30-35. doi: 10.4236/msce.2016.45005.

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