Author(s)

Y. A. M. Yousif^*, Casper A. Willemse

Medical Physics Department, Faculty of Health Sciences, University of the Free State, Bloemfontein, South Africa.

Total skin electron therapy (TSET) is used for the treatment of Mycosis Fungoides. Several tech-niques have been developed, in order to achieve homogeneous dose distribution over the complete body surface. To implement a TSET technique, one has to optimize a variety of parameters. Monte Carlo simulation of TSET can facilitate this optimization. The aim of this study was to commission and optimize a TSET technique using the 4 and 6 MeV electron and the high dose rate facility on the Elekta Precise accelerator. The EGS4nrc/BEAMnrc Monte Carlo code was used. The beam data were calculated and measured at two different scoring planes for a single beam. The Model was validated by comparing the simulation with measurements. Two different vertical angles were used to obtain a uniform dose. The angle was optimized for best dose uniformity. The Rando phantom is placed on a rotating platform and rotates 60 degrees apart to facilitate the six patient position orientations. The doses delivered in a phantom by complete treatment were measured with Kodak EDR2 films and TLDs. The dose distribution varied among various scanning directions by 2 - 3 mm and 3 - 4 mm for 4 and 6 MeV respectively. The composite percentage depth dose of all six dual fields for the 4 and 6 MeV yielded an R80 of ~4 mm and ~6 mm, respectively. Dose uniformity was ±6% for 4 MeV and ±5% for 6 MeV. The bremsstrahlung contamination was 0.9% - 1.3%. Good agreements were found with published literature and inline with international protocols.

Total Skin Electron Therapy, Mycosis Fungoides, High Dose Rate Electron, Monte Carlo Simulation

A. M. Yousif, Y. and A. Willemse, C. (2015) Commissioning and Optimization of a Total Skin Electron Therapy Technique Using a High Dose Rate Electron Facility. International Journal of Medical Physics, Clinical Engineering and Radiation Oncology, 4, 197-207. doi: 10.4236/ijmpcero.2015.43024.