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A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray and S. Vo, “A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications,” National Institute of Standard Technologies Special Publication, Washington DC, 2010, pp. 1-200.
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