has been cited by the following article(s):
[1]
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Radiation Hardness Assurance of Single Event Effects on Components for Space Application
2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED),
2021
DOI:10.1109/ICREED52909.2021.9588712
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[2]
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Latent Single-Event Latchup-induced damage in Complementary Metal-Oxide- Semiconductor
2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
2018
DOI:10.1109/RADECS45761.2018.9328692
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[3]
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Investigation of SEE Breakdown in CCD Image Sensor
2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
2018
DOI:10.1109/RADECS45761.2018.9328684
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