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G. Xu, P. Jin, M. Tazawa and K. Yoshimura, “Thickness Dependence of Optical Properties of VO2 Thin Films Epitaxially Grown on Sapphire (0 0 0 1),” Applied Surface Science, Vol. 244, No. 1-4, 2005, pp. 449-452. doi:10.1016/j.apsusc.2004.09.157

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