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S. G. Lim, S. Kriventsov, T. N. Jackson, J. H. Haeni, D. G. Schlom, A. M. Balbashov, R. Uecker, P. Reiche, J. L. Freeouf and G. Lucovsky, “Dielectric Functions and Optical Bandgaps of High-K Dielectrics for Metal-OxideSemiconductor Field-Effect Transistors by far Ultraviolet Spectroscopic Ellipsometry,” Journal of Applied Physics, Vol. 91, No. 7, 2002, pp. 4500-4505. doi:10.1063/1.1456246

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