M. D. Biegalski, et al., “Relaxor Ferroelectricity in Strained Epitaxial SrTiO₃ Thin Films on DyScO₃ Substrates,” Applied Physics Letters, Vol. 88, No. 19, 2006, Article ID: 192907. doi:10.1063/1.2198088

has been cited by the following article:

• TITLE: Thickness Dependence of Dielectric Characteristics of SrTiO3 Thin Films on MgAl2O4 Substrates

  AUTHORS: Ryuhei Kinjo, Iwao Kawayama, Hironaru Murakami, Masayoshi Tonouchi

  KEYWORDS: Strontium Titanate; Ferroelectric; Soft Mode; Thin Film; Strain Effect

  JOURNAL NAME: Advances in Materials Physics and Chemistry, Vol.3 No.1, March 28, 2013

  ABSTRACT: SrTiO3 (STO) thin films of different thicknesses were deposited on MgAl2O4 (MAO) substrates to investigate the in-plane strain effect on the soft-mode frequency of the STO films. X-ray reciprocal space mapping (X-RSM) results indicate that there was no relaxation of the in-plane lattice strain of the STO films on MAO. Shifts in the soft-mode frequencies with a decrease in the film thickness were observed using terahertz time-domain spectroscopy (THz-TDS). However, despite the larger lattice mismatch between STO and MAO than that between STO and DyScO3 (DSO), the shifts in the soft-mode frequencies of the STO films on MAO were smaller than those on DSO. The results indicate that the soft-mode frequencies of the STO films on MAO are affected by the c-axis (out-of-plane) lengths.