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McCrackin, F.L., Passaglia, E., Stromberg, R.R. and Steinberg, H.L. (1963) Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces by Ellipsometry. Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry, 67, 363-377.
https://doi.org/10.6028/jres.067A.040

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