Article citationsMore>>

Hung, K.K., Ko, P.K., Hu, C. and Cheng, Y.C. (1990) A Unified Model for the Flicker Noise in Metal-Oxide-Semiconductor Field-Effect Transistors. IEEE Transactions on Electron Devices, 37, 654-665.
https://doi.org/10.1109/16.47770

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top