Article citationsMore>>
Y.-C. Yeo, T.-J. King and C. Hu, “Direct Tunneling Gate Leakage and Scalality of Alternative Gate Dielectrics,” Applied Physics Letters, Vol. 81, No. 11, 2002, pp. 2091- 2093. doi:10.1063/1.1506941
has been cited by the following article:
Related Articles:
-
Abdou Karim Diallo, Abdoul Kadri Diallo, Diouma Kobor, Marcel Pasquinelli
-
Ahmed Y. Mohammed, Moayed S. Khaleel
-
Luis F. Copertari
-
Jasper van Veen, Andres Castellanos- Gomez, Herre S. J. van der Zant, Gary A. Steele
-
Luis F. Copertari