Article citationsMore>>

Kimmle, C., Wolff, S., Doering, C. and Fouckhardt, H. (2013) Dependence of Fused-Silica Etch Rate on the Etch Mask Opening Diameter. Microelectronic Engineering, 112, 10-13.
http://dx.doi.org/10.1016/j.mee.2013.05.006

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top