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Evaluation of the Structure–Micromorphology Relationship of Co10%–Alx Co-doped Zinc Oxide Nanostructured Thin Films Deposited by Pulsed Laser Using XRD and AFM
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Influence of deposition time on the optical and morphological properties of silver–copper thin films: experimental and statistical studies
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2021
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Micromorphology and microtexture evaluation of poly(o-ethoxyaniline) films using atomic force microscopy and fractal analysis
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Bi-fractal and bi-Gaussian theories to evaluate impact of polythiophene-coated Fe3O4 nanoparticles on asphaltene precipitation and surface topography
Fuel,
2020
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Further optimization of ITO films at the melting point of Sn and configuration of Ohmic contact at the c-Si/ITO interface
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Non-Contact Roughness Measurement in Sub-Micron Range by Considering Depolarization Effects
Sensors,
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Power spectral density-based fractal analysis of annealing effect in low cost solution-processed Al-doped ZnO thin films
Physica Scripta,
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Applied Surface Science,
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Room-temperature ITO electrodes evaluated for organic solar cells using a photonic flux density figure of merit
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2018
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Characterization studies of the structure and properties of Zr-doped SnO2 thin films by spin-coating technique
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Fractal Nature of Nanocomposite Thin Films with Co NPs in a-C:H Matrix
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Materials Research Express,
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Highly efficient exciplex organic light-emitting devices employing a sputtered indium-tin oxide electrode with nano-pinhole morphology
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Fractal analysis of nanostructured silver film surface
Chinese Journal of Physics,
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Light Emission Properties of a Cross-Conjugated Fluorene Polymer: Demonstration of Its Use in Electro-Luminescence and Lasing Devices
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Synthesis of Ag–Cu–Pd alloy by DC-magnetron sputtering: micromorphology analysis
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2016
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Optical modeling and optimizations of Cu_2ZnSnSe_4 solar cells using the modified transfer matrix method
Optics Express,
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Optik - International Journal for Light and Electron Optics,
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AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates
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Polycrystalline indium phosphide on silicon using a simple chemical route
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Journal of Applied Physics,
2013
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