Y. Ono, T. Oku, T. Akiyama, Y. Kanamori, Y. Ohnishi, Y. Ohtani and M. Murozono, “Microstructure Analysis of Spherical Silicon Solar Cells Coated with Anti-Reflection Films,” Journal of Physics: Conference Series, Vol. 352, 2012, Article ID: 012023. doi:10.1088/1742-6596/352/1/012023

has been cited by the following article:

• TITLE: Microstructure Analysis and Properties of Anti-Reflection Thin Films for Spherical Silicon Solar Cells

  AUTHORS: Masato Kanayama, Takeo Oku, Tsuyoshi Akiyama, Youichi Kanamori, Satoshi Seo, Jun Takami, Yoshimasa Ohnishi, Yoshikazu Ohtani, Mikio Murozono

  KEYWORDS: Solar Cells; Spherical Silicon; Anti-Reflection Film; FTO; SnO2

  JOURNAL NAME: Energy and Power Engineering, Vol.5 No.2A, April 29, 2013

  ABSTRACT: Structure and properties of anti-reflection thin films of spherical silicon solar cells were investigated and discussed. Conversion efficiencies of spherical Si solar cells coated with F-doped SnO2 anti-reflection films were improved by annealing. Optical absorption and fluorescence of the solar cells increased after annealing. Lattice constants of F-doped SnO2 anti-reflection layers, which were investigated by X-ray diffraction, decreased after annealing. A mechanism of atomic diffusion of F in SnO2 was discussed. The present work indicated a guideline for spherical silicon solar cells with higher efficiencies.