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De Keijser, T.H., Langford, J.I., Mittemeijer, E.J. and Vogels, A.B.P. (1982) Use of the Voigt Function in a SingleLine Method for the Analysis of X-Ray-Diffraction Line Broadening. Journal of Applied Crystallography, 15, 308-314.
http://dx.doi.org/10.1107/S0021889882012035

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