TITLE:
Characterization of Short-Term Stress Applied to the Root System by Electrical Impedance Measurement in the First Leaf of Corn (Zea mays L.) and Pumpkin (Cucurbita maxima L.)
AUTHORS:
Saïd Laarabi
KEYWORDS:
Abiotic Stress Characterization; Corn and Pumpkin; Electrical Bioimpedance; in Vivo Diagnosis Foliar; Root-Environment
JOURNAL NAME:
American Journal of Plant Sciences,
Vol.5 No.9,
April
11,
2014
ABSTRACT:
We applied electrical spectroscopic impedance measurements (ESI) to the
first leaf of intact plants of corn and pumpkin. The electric capacity (C) and
resistance (Rp) were determined at the characteristic frequency (FC). We
observed that the electrical parameters of the ESI change in relation to the
nutrition and the addition to the root medium of KCN, N,N'-dicyclohexylcar-bodiimide
(DCCD), CH3COOH, H2SO4, polyethylene glycol
200 (PEG 200) and NaCl. The amplitude of the curves of bioimpedance
spectrometry decreased when plant roots were stressed comparatively to their
controls. An increase of the electrical capacity with a reduction of the
electrical resistance characterizes a stress. The increase of stress intensity
provokes decreases of Rp and curve amplitudes and an increase of C. We conclude
that electrical parameters studied can be widely used for stress
characterization.