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J. C. Koepke, J. D. Wood, D. Estrada, Z.-Y. Ong, K. T. He, E. Pop and J. W. Lyding, “Atomic-Scale Evidence for Potential Barriers and Strong Carrier Scattering at Graphene Grain Boundaries: A Scanning Tunneling Microscopy Study,” ACS Nano, Vol. 7, No. 1, 2013, pp. 75-86. doi:10.1021/nn302064p

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