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Rai, S.K., Kumar, A., Shankar, V., Jayakumar, T., Bhanu Sankara Rao, K. and Raj, B. (2004) Characterization of Microstructures in Inconel 625 Using X-Ray Diffraction Peak Broadening and Lattice Parameter Measurements. Scripta Materialia, 51, 59-63.
https://doi.org/10.1016/j.scriptamat.2004.03.017

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