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N. Ma, B. Shen, F. J. Xu, L. W. Lu, Z. H. Feng, Z. G. Zhang, S. B. Dun, C. P. Wen, J. Y. Wang, F. Lin, D. T. Zhang and M. Sun, “Current-Controlled Negative Differential Resistance Effect Induced by Gunn-Type Instability in n-Type GaN Epilayers,” Applied Physical Letters, Vol. 96, 2010, Article ID: 242104. http://dx.doi.org/10.1063/1.3455070

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