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Wilson, M., Lagowski, J., Jastrzebski, L., Savtchouk, A. and Faifer, V. (2001) COCOS (Corona Oxide Characterization of Semiconductor) Non-Contact Metrology for Gate Dielectrics. AIP Conference Proceedings, 550, 220-225.
https://doi.org/10.1063/1.1354401

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