has been cited by the following article(s):
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[1]
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Influence of Implantation of Ions Ba+ on the Composition and Electronic Structure of Silicate Glasses
Поверхность. Рентгеновские, синхротронные и нейтронные исследования,
2023
DOI:10.31857/S1028096023030184
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[2]
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Influence of Implantation of Ions Ba+ on the Composition and Electronic Structure of Silicate Glasses
Поверхность. Рентгеновские, синхротронные и нейтронные исследования,
2023
DOI:10.31857/S1028096023030184
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[3]
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An optical method for evaluating the degradation mechanism of a developing RuO2 thick film resistor element for power modules
Journal of the Ceramic Society of Japan,
2017
DOI:10.2109/jcersj2.16319
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[4]
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Current Transport Through Lead–Borosilicate Interfacial Glass Layers at the Screen–Printed Silver-Silicon Front Contact
IEEE Journal of Photovoltaics,
2015
DOI:10.1109/JPHOTOV.2015.2409561
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[5]
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On the Conduction Mechanism of Silicate Glass Doped by Oxide Compounds of Ruthenium (Thick Film Resistors)
World Journal of Condensed Matter Physics,
2011
DOI:10.4236/wjcmp.2011.12004
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