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W. Burkhardt, T. Christmann, B. K. Meyer, W. Niessner, D. Schalch and A. Scharmann, “W- and F-doped VO2 Films Studied by Photoelectron Spectrometry,” Thin Solid Films, Vol. 345, No. 2, 1999, pp. 229-235. doi:10.1016/S0040-6090(98)01406-0

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