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M. Gassoumi, J. M. Bluet, G. Guillot, C. Gaquière and H. Maaref, “Characterization of Deep Levels in High Elec- tron Mobility Transistor by Conductance Deep Level Transient Spectroscopy,” Materials Science and Engi- neering C, Vol. 26, 2006, pp. 787-790.

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