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has been cited by the following article:

• TITLE: Physical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique

  AUTHORS: Inas Battisha, Amany El Nahrawy

  KEYWORDS: Sol-Gel; Nano-Structure SiO2P2O5 Thin Film; Scanning Electron Microscopy (SEM); XRD and FTIR

  JOURNAL NAME: New Journal of Glass and Ceramics, Vol.2 No.1, January 12, 2012

  ABSTRACT: A series of silica-phosphate nano-composites prepared as a host thin films Physical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique and doped with different concentrations of Er3+ ions have been synthesized using tetraesoxysilane TEOS, triethylphosphate TEP and erbium nitrate as precursor sources of silica, phosphorus and erbium oxides. The structural properties of pure silica-phosphate thin films and doped with different concentrations of Er3+ ions were studied, using x-ray diffraction (XRD) and Fourier Transform Infrared (FTIR). The morphology of silica-phosphate was characterized by Scanning electron microscope (SEM).