Article citationsMore>>

M. Biber, O. Gullu, S. Forment, R. L. Van Meirhaeghe and A. Turut, “The Effect of Schottky Metal Thickness on Barrier Height Inhomogeneity in Identically Prepared Au/n-GaAs Schottky Diodes,” Semiconductor Science and Technology, Vol. 21, No. 1, 2006, pp. 1-5. Doi.10.1088/0268-1242/21/1/001

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top