Tenne, D.A., Turner, P., Schmidt, J.D., Biegalski, M., Li, Y.L., Chen, L.Q., Soukiassian, A., Trolier-McKinstry, S., Schlom, D.G., Xi, X.X., Fong, D.D., Fuoss, P.H., Eastman, J.A., Syephenson, G.B., Thompson, C.T. and Streiffer, S.K. (2009) Ferroelectricity in Ultrathin BaTiO3 Films: Probing the Size Effect by Ultraviolet Raman Spectroscopy. Physical Review Letters, 103, 177601.
http://dx.doi.org/10.1103/PhysRevLett.103.177601

has been cited by the following article:

• TITLE: Ferroelectricity in Layered Perovskites as a Model of Ultra-Thin Films

  AUTHORS: Masanori Fukunaga, Masaki Takesada, Akira Onodera

  KEYWORDS: Ferroelectricity, Layered Oxide, Perovskite, Thin Film, Size Effect

  JOURNAL NAME: World Journal of Condensed Matter Physics, Vol.6 No.3, August 12, 2016

  ABSTRACT: The instability of thin ferroelectric films is discussed based on the close similarity of dielectric properties between bulk Bi-layered perovskites and thin BaTiO3 films. The dielectric properties of pseudo-two-dimensional layered perovskites suggest that the bulk layered ferroelectric is a good model of ultra-thin ferroelectric film with a few perovskite units, free from any misfit lattice strain. It seems plausible that the ferroelectric interaction is still prominent but shows a crossover from ferroelectric to antiferroelectric along the unique c-axis (perpendicular to the film plane); with decreasing thickness, the ferroelectricity appears within the plane, which results in so-called “canted ferroelectricity”. An extra relaxation mode induced by surface effect of thin films correlates with soft mode, which results in a new intermediate phase between the paraelectric and ferroelectric phases. These evidences may indicate no critical thickness even for ferroelectric ultra- thin films.