Article citationsMore>>
Levin, A., Weiss, Y., Durand, F. and Freeman, W.T. (2009) Understanding and Evaluating Blind Deconvolution Algorithms. IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops), Miami, 20-25 June 2009, 1964-1971.
has been cited by the following article:
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TITLE:
Topography Measurement for Monitoring Manufacturing Processes in Harsh Conditions
AUTHORS:
Thomas Mueller, Andreas Poesch, Eduard Reithmeier
KEYWORDS:
Optical Inspection, Topography Measurement, Laser Triangulation, Precision Manufacturing
JOURNAL NAME:
Engineering,
Vol.8 No.5,
May
23,
2016
ABSTRACT: High precision manufacturing, e.g. milling and grinding, which have manufacturing tolerances in the range of
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