TITLE:
Analysis of Recent Secure Scan Test Techniques
AUTHORS:
Cheng Xing, Sungju Park, Ji Zhao
KEYWORDS:
Side Channel Attack, Scan Test Techniques, Secure Scan Designs
JOURNAL NAME:
Journal of Software Engineering and Applications,
Vol.9 No.3,
March
31,
2016
ABSTRACT: Side channel attack may result in user key
leakage as scan test techniques are applied for crypto-graphic chips. Many
secure scan designs have been proposed to protect the user key. This paper
meticulously selects three current scan test techniques, analyses their
advantages and disadvantages and also compares them in security and area
overhead. Users can choose one of them according to the requirements and
further combination can be implemented to achieve better performance.