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Soylu, M., Al-Hartomy, O.A., Al Said, S.A.F., Al-Ghamdi, A.A., Yahia, I.S. and Yakuphanoglu, F. (2013) Microelectronics Reliability, 53, 1901-1906.
http://dx.doi.org/10.1016/j.microrel.2013.05.008

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