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Thomsen, A.H.N.B., Mogensenc, K.S., Eskildsen, S.S., Mathiasen, C. and Bùttiger, J. (1998) Residual Stress Determination in PECVD TiN Coatings by X-Ray Diffraction: A Parametric Study. Thin Solid Films, 333, 50-59.
http://dx.doi.org/10.1016/S0040-6090(98)00804-9

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