Prof. Christophe J. Muller

French National Centre for Scientific Research, France

CNRS Research Director

Email: christophe.muller@im2np.fr

Qualifications

1996 Ph.D., University Joseph Fourier, France

1991 M.Sc., University of Nice, France

1990 B.Sc., University of Nice, France

Publications (Selected)

1. Putero, M., Coulet, M. V., Muller, C., Baehtz, C., Raoux, S., & Cheng, H. Y. (2016). Ge-doped GaSb thin films with zero mass density change upon crystallization for applications in phase change memories. Applied Physics Letters, 108(10).
2. Putero, M., Coulet, M. V., Muller, C., Cohen, G., Hopstaken, M., Baehtz, C., & Raoux, S. (2014). Density change upon crystallization of Ga-Sb films. Applied Physics Letters, 105(18).
3. Zhao, W. S., Portal, J. M., Kang, W., Moreau, M., Zhang, Y., Aziza, H., ... & Chappert, C. (2014). Design and analysis of crossbar architecture based on complementary resistive switching non-volatile memory cells. Journal of Parallel and Distributed Computing, 74(6), 2484-2496.
4. Cabout, T., Vianello, E., Jalaguier, E., Grampeix, H., Molas, G., Blaise, P., ... & Muller, C. (2014, May). Effect of SET temperature on data retention performances of HfO 2-based RRAM cells. In 2014 IEEE 6th International Memory Workshop (IMW) (pp. 1-4). IEEE.
5. Faivre, E., Llido, R., Putero, M., Fares, L., & Muller, C. (2014). Nanostructural defects evidenced in failing silicon-based NMOS capacitors by advanced failure analysis techniques. The European Physical Journal Applied Physics, 66(1), 10103.
6. Tirano, S., Perniola, L., Cagli, C., Jalaguier, E., Jousseaume, V., Deleruyelle, D., ... & Reimbold, G. (2014). Temperature Impact on Reliablity and Manufacturing of Embedded HfOx-Based RRAM: a Novel Pre-coding Method for Bypassing Soldering Reflow. ECS Transactions, 61(2), 311.
7. Zhao, W., Moreau, M., Deng, E., Zhang, Y., Portal, J. M., Klein, J. O., ... & Chappert, C. (2013). Synchronous non-volatile logic gate design based on resistive switching memories. IEEE Transactions on Circuits and Systems I: Regular Papers, 61(2), 443-454.
8. Bocquet, M., Deleruyelle, D., Aziza, H., Muller, C., Portal, J. M., Cabout, T., & Jalaguier, E. (2014). Robust compact model for bipolar oxide-based resistive switching memories. IEEE transactions on electron devices, 61(3), 674-681.
9. Bocquet, M., Deleruyelle, D., Aziza, H., Muller, C., Portal, J. M., Cabout, T., & Jalaguier, E. (2014). Robust compact model for bipolar oxide-based resistive switching memories. IEEE transactions on electron devices, 61(3), 674-681.
10. Putero, M., Coulet, M. V., Ouled-Khachroum, T., Muller, C., Baehtz, C., & Raoux, S. (2013). Phase transition in stoichiometric GaSb thin films: anomalous density change and phase segregation. Applied Physics Letters, 103(23).
11. Putero, M., Coulet, M. V., Ouled-Khachroum, T., Muller, C., Baehtz, C., & Raoux, S. (2013). Unusual crystallization behavior in Ga-Sb phase change alloys. Apl Materials, 1(6).
12. Aziza, H., Bocquet, M., Portal, J. M., Moreau, M., & Muller, C. (2013). A novel test structure for OxRRAM process variability evaluation. Microelectronics Reliability, 53(9-11), 1208-1212.

Profile Details

WoS ResearcherID: JCE-0732-2023

https://scholar.google.com/citations?user=qzGTqKkAAAAJ&hl=en

https://www.researchgate.net/profile/Christophe-Muller-2/4

https://ieeexplore.ieee.org/author/37303115200