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W. Suntao, W. Yanhua and S. Qihua, “Measurement and Analysis of the Characteristic Parameters for the Porous Silicon/Silicon Using Photovoltage Spectra,” Applied Surface Science, Vol. 158, No. 3-4, 1999, pp. 268-274.
doi:10.1016/S0169-4332(00)00008-8
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