Article citationsMore>>

M. Nauer, K. Ernst, W. Kautek and M. Neumann-Spallart, “Depth Profile Characterization of Electrodeposited MultiThin-Film Structures by Low Angle of Incidence X-Ray Diffractometry,” Thin Solid Films, Vol. 489, No. 1-2, 2005, pp. 86-93. doi:10.1016/j.tsf.2005.05.008

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.