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Y. C. Lin, D. T. Lambe, C. Y. Park, M. R. Wasserman, X. Trepat, R. Krishnan, G. Lenormand, J. F. Fredberg and J. P. Butler, “Mechanosensing of Substrate Thickness,” Physical Review E, Vol. 82, No. 4, 2010, Article ID: 041918. http://dx.doi.org/10.1103/PhysRevE.82.041918

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